Method and program product for designing source and mask for lithography

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United States of America Patent

PATENT NO 9857676
SERIAL NO

14892987

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Abstract

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A system and method for optimizing (designing) a mask pattern, in which SMO and OPC are collaboratively used to exert a sufficient collaborative effect or are appropriately used in different manners.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inoue, Tadanobu Tokyo, JP 52 610
Melville, David O Yorktown Heights, US 24 162
Rosenbluth, Alan E Yorktown Heights, US 84 1570
Sakamoto, Masaharu Tokyo, JP 106 1417
Tian, Kehan Hopewell Junction, US 58 224

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