Automated test equipment, instruction provider for providing a sequence of instructions, method of providing signal to a device under test, method for providing a sequence of instructions and test system
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United States of America Patent
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Jan 2, 2018
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app pub date -
Feb 5, 2016
filing date -
Aug 9, 2013
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Abstract
An automated test equipment includes a test processor configured to provide a signal to a device under test on the basis of a sequence of instructions defining an evaluation of test vectors. The test processor is configured to map a test vector onto a set of signal states or signal transitions. Furthermore, the test processor is configured to variably select a number of signal states or signal transitions provided in the signal based on a current test vector in dependence on a current instruction.
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