Dynamic design partitioning for diagnosis

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United States of America Patent

PATENT NO 9857421
SERIAL NO

15146761

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Abstract

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Aspects of the invention relate to techniques for fault diagnosis based on dynamic circuit design partitioning. According to various implementations of the invention, a sub-circuit is extracted from a circuit design based on failure information of one or more integrated circuit devices. The extraction process may comprise combining fan-in cones of failing observation points included in the failure information. The extraction process may further comprise adding fan-in cones of one or more passing observation points to the combined fan-in cones of the failing observation points. Clock information of test patterns and/or layout information of the circuit design may be extracted and used in the sub-circuit extraction process. The extracted sub-circuit may then be used for diagnosing the one or more integrated circuit devices.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS INDUSTRY SOFTWARE INC5800 GRANITE PARKWAY SUITE 600 PLANO TX 75024-6612

International Classification(s)

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  • 2016 Application Filing Year
  • G06F Class
  • 60255 Applications Filed
  • 46180 Patents Issued To-Date
  • 76.65 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Benware, Robert B Clackamas, US 8 21
Cheng, Wu-Tung Lake Oswego, US 93 1271
Fan, Xiaoxin Tualatin, US 13 46
Huang, Yu Sudbury, US 357 4038
Tang, Huaxing Wilsonville, US 22 374

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  • G06F Class
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges785123150394313806693311801076047295401 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +02000400060008000100001200014000160001800020000220002400026000

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