X-ray fluoroscopic imaging system

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United States of America Patent

PATENT NO 9857317
APP PUB NO 20150185166A1
SERIAL NO

14582069

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Abstract

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The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.

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Patent Owner(s)

Patent OwnerAddress
TSINGHUA UNIVERSITY100084 NO 1 TSINGHUA YUAN BEIJING HAIDIAN DISTRICT BEIJING CITY BEIJING CITY 100084
NUCTECH COMPANY LIMITED100084 BEIJING CITY HAIDIAN DISTRICT SHUANGQING ROAD WITH PARTY BUILDING A BLOCK 2 LAYER MUNICIPAL DISTRICT BEIJING CITY 100084

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Huaibi Beijing, CN 32 268
Chen, Zhiqiang Beijing, CN 429 2689
Li, Yuanjing Beijing, CN 274 2040
Liu, Yaohong Beijing, CN 109 597
Qin, Zhanfeng Beijing, CN 12 117
Sun, Shangmin Beijing, CN 75 687
Tang, Chuanxiang Beijing, CN 50 749
Tang, Huaping Beijing, CN 34 229
Yan, Xinshui Beijing, CN 13 58
Zhao, Ziran Beijing, CN 241 1415

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