Apparatus and method for inertial sensor calibration
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United States of America Patent
Stats
-
Jan 2, 2018
Issued Date -
N/A
app pub date -
Feb 4, 2016
filing date -
Feb 4, 2015
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An inertial sensor system according to one embodiment having a platform with an x axis and a y axis, a rotational table that is free to rotate about the x axis, a rotational table gyroscope mounted onto the rotational table to measure p, q, and r rotation rates referenced to the rotational table and at least one platform gyroscope mounted off the rotational table, wherein the rotational table gyroscope and the platform gyroscope provide sense rotation used to process gyroscope biases that are used to correct measurements for the inertial sensing system.
First Claim
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International Classification(s)
- 2016 Application Filing Year
- G01P Class
- 759 Applications Filed
- 541 Patents Issued To-Date
- 71.28 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01P Class
- 18.75 % this patent is cited more than
- 7 Age
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