Method for implementing high-precision orientation and evaluating orientation precision of large-scale dynamic photogrammetry system

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United States of America Patent

PATENT NO 9857172
SERIAL NO

15714070

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Abstract

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The present invention provides a method for implementing high-precision orientation and evaluating orientation precision of a large-scale dynamic photogrammetry system, including steps: a) selecting a scale bar, arranging code points at two ends of the scale bar, and performing length measurement on the scale bar; b) evenly dividing a measurement space into multiple regions, sequentially placing the scale bar in each region, and photographing the scale bar by using left and right cameras; d) limiting self-calibration bundle adjustment by using multiple length constraints, adjustment parameters including principal point, principal distance, radial distortion, eccentric distortion, in-plane distortion, exterior orientation parameter and spatial point coordinate; and e) performing traceable evaluation of orientation precision of the photogrammetry system. The present invention can effectively reduce the relative error in length measurement.

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Patent Owner(s)

Patent OwnerAddress
BEIJING INFORMATION SCIENCE AND TECHNOLOGY UNIVERSITY100192 BEIJING CITY HAIDIAN DISTRICT QINGHE SMALL CAMP ROAD NO 12 BEIJING CITY BEIJING CITY 100192

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dong, Mingli Beijing, CN 17 92
Li, Wei Beijing, CN 2284 14552
Lv, Naiguang Beijing, CN 1 0
Sun, Peng Beijing, CN 452 1010
Wang, Jun Beijing, CN 2215 18848
Yan, Bixi Beijing, CN 1 0

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