Parametric control of object scanning

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9857163
SERIAL NO

14523251

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Calculated Rating
US Family Size
Non-US Coverage
Patent Longevity
Forward Citations

Abstract

See full text

A method of measuring an object having associated geometric data and material data receives the geometric data and material data relating to the object, and controls an x-ray device to scan the object. The x-ray device operates in accordance with a plurality of operating parameters. The method then varies at least one of the operating parameters during the scan as a function of one or both the geometric data and the material data.

First Claim

See full text

Other Claims data not available

Family

PCTEP
+

Patent Owner(s)

Patent OwnerAddress
HEXAGON METROLOGY INC250 CIRCUIT DRIVE NORTH KINGSTOWN RI 02852

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Darrouzet, Stephen West Warwick, US 5 33
O'Hare, Jonathan J Warwick, US 45 292

Cited Art Landscape

Load Citation

Patent Citation Ranking

  • 0 Citation Count
  • G06T Class
  • 0 % this patent is cited more than
  • 7 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges2246476526853201 - 1011 - 2021 - 3031 - 4041 - 5051 - 60100 +050100150200250300350400450500550600650700

Forward Cite Landscape

Load Citation

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
7.5 Year Payment $3600.00 $1800.00 $900.00 Jul 2, 2025
11.5 Year Payment $7400.00 $3700.00 $1850.00 Jul 2, 2029