High voltage device and manufacturing method thereof

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United States of America Patent

PATENT NO 9853100
SERIAL NO

15490662

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Abstract

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The present invention provides a high voltage device and manufacturing method thereof. The high voltage device includes: a semiconductor substrate, an isolation structure, a gate, a body region, a well, a source, a drain and a lightly doped diffusion (LDD) region. The isolation structure is formed on an upper surface of the semiconductor substrate, for defining a device region, The LDD region is formed on the well in the device region. In a lateral direction, the LDD region is located between the gate and the drain, and the LDD region is not in direct contact with the drain.

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Patent Owner(s)

Patent OwnerAddress
RICHTEK TECHNOLOGY CORPORATION14F-1 NO 8 TAIYUEN 1ST ST ZHUBEI CITY HSINCHU COUNTY 30288

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Tsung-Yi Hsinchu, TW 142 613
Tsai, Tsung-Ying Tainan, TW 33 176
You, Kun-Hun Hsinchu, TW 1 1

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