Inventory-cycle-based RFID tag location

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United States of America Patent

PATENT NO 9852319
SERIAL NO

15201231

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Abstract

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Techniques are provided to estimate the location of an RFID tag using tag read information, such as a tag read count or a tag read rate, and an opportunity metric, such as an inventory cycle duration, inventory cycle rate, or inventory cycle count. A tag tracking system determines read information for a tag in a zone and an opportunity metric associated with the tag and the zone. The tag tracking system then computes a success rate based on the tag read information and opportunity metric, and uses the success rate to estimate the location of the tag.

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Patent Owner(s)

Patent OwnerAddress
IMPINJ INC400 FAIRVIEW AVENUE N SUITE 1200 SEATTLE WA 98109

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Anderl, Thomas Seattle, US 3 121
Ascani, Robert J Seattle, US 6 50
Pesavento, Alberto Seattle, US 63 1224

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