Light wavelength measurement method and light wavelength measurement apparatus

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United States of America Patent

PATENT NO 9846081
SERIAL NO

14775321

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Abstract

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A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).

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Patent Owner(s)

Patent OwnerAddress
OSAKA UNIVERSITYSUITA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Konishi, Tsuyoshi Osaka, JP 20 46
Nagashima, Tomotaka Osaka, JP 15 24
Satoh, Takema Osaka, JP 2 1

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