Optimization of high resolution digitally encoded laser scanners for fine feature marking
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United States of America Patent
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Dec 12, 2017
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N/A
app pub date -
Jul 3, 2014
filing date -
Feb 21, 2013
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Abstract
Disclosed herein are laser scanning systems and methods of their use. In some embodiments, laser scanning systems can be used to ablatively or non-ablatively scan a surface of a material. Some embodiments include methods of scanning a multi-layer structure. Some embodiments include translating a focus-adjust optical system so as to vary laser beam diameter. Some embodiments make use of a 20-bit laser scanning system.
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