Photomasks for reducing thermal stress generated by heat

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United States of America Patent

PATENT NO 9841668
SERIAL NO

15582011

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Abstract

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A photomask includes a light transmission substrate having a transfer region and a frame region, a light-transmitting region exposing a portion of the light transmission substrate in the transfer region corresponding to a transfer pattern, a phase shift region surrounding the light-transmitting region in the transfer region. The phase shift region includes a first phase shift region surrounding the light-transmitting region and a second phase shift region surrounding the first phase shift region. A first phase shift pattern is disposed on the light transmission substrate in the first phase shift region, and a plurality of second phase shift patterns are disposed on the light transmission substrate in the second phase shift region.

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Patent Owner(s)

Patent OwnerAddress
SK HYNIX INCGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nam, Byung Ho Daegu, KR 12 22

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges24981276246323701 - 1011 - 2021 - 3031 - 4051 - 6061 - 7081 - 90100 +050100150200250300350400450500550600650700750800850900

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