Material discrimination using scattering and stopping of muons and electrons
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United States of America Patent
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Dec 12, 2017
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Aug 10, 2015
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Aug 11, 2014
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Abstract
In one aspect, a process for characterizing a range of materials based on the scattering and stopping of incident cosmic ray charged particles passing through each material includes: determining a scattering metric and a stopping metric for each material within the range of materials exposed to cosmic ray charged particles; computing a ratio of the scattering metric to the stopping metric to obtain a scattering-to-stopping ratio for each material within the range of materials for the material; and establishing a scattering-stopping relationship for the range of materials based on the determined pairs of the scattering-to-stopping ratio and the associated scattering metric for the range of materials.
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