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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
RENISHAW PLC	GLOUCESTERSHIRE GLOUCESTERSHIRE

International Classification(s)

• B82Y:SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; ....
• B23K:SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLA....
• G01D:MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VAR....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Ardron, Marcus	Edinburgh, GB	8	60
Dardis, John	Bristol, GB	7	19
Henshaw, James Reynolds	Stroud, GB	23	78
Kidd, Matthew Donald	Stirling, GB	5	7
Thomson, Robert	Edinburgh, GB	14	340
Weston, Nicholas John	Peebles, GB	29	530

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
7.5 Year Payment	$3600.00	$1800.00	$900.00	Oct 17, 2025
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Oct 17, 2029

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 7.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
April 17, 2018	US,9945697,B2   US9945697B2	GRANTED PATENT AS SECOND PUBLICATION
December 12, 2017	US,9841300,B2   US9841300B2	GRANTED PATENT AS SECOND PUBLICATION
December 24, 2015	US,20150369637,A1   US20150369637A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 9841300

Measurement scale with periodic nanostructure

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