Calibration of high frequency signal measurement systems
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 5, 2017
Grant Date -
Dec 10, 2015
app pub date -
Oct 24, 2013
filing date -
Oct 26, 2012
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method of calibrating a high frequency signal measurement system is described. The measurement system is in the form of a network analyzer (6) and has first and second phase-locked signal sources (SS1 & SS2) and at least two measurement receivers (18a, 18b). A phase meter (26) is provided. A reference signal (F0) is outputted at a first frequency from the first signal source (SS1). The second signal source (SS2) steps through a multiplicity of different test frequencies (nF0), being phase-locked with the reference signal (F0), which are applied in turn to a part of the measurement system. Measurements are taken, via the two measurement receivers (18a, 18b), of characteristics of the resulting signal at a measurement plane. The absolute phase of the signal at the measurement plane is also measured with the phase meter (26). Calibration data is generated which relates the characteristics of the signals as measured by the measurement system (6) and the absolute phase as measured with the phase meter (26).
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully