Split-gate flash memory having mirror structure and method for forming the same

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United States of America Patent

PATENT NO 9831354
SERIAL NO

14968108

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Abstract

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Split-gate flash memory and forming method thereof are provided. The method includes: forming a first dielectric layer on a semiconductor substrate; forming a floating gate layer on the first dielectric layer; forming a mask layer on the floating gate layer; etching the mask layer until first groove exposing the floating gate layer is formed; forming a protective sidewall on sidewall of the first groove; forming a gate dielectric layer on bottom and the sidewall of the first groove; forming two control gates on the gate dielectric layer, the remained first groove serving as second groove; etching the gate dielectric layer and the floating gate layer at bottom of the second groove until third groove exposing the first dielectric layer is formed; forming a source in the semiconductor substrate under the third groove; and forming a second dielectric layer in the third groove. Reliability and durability of the memory are improved.

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Patent Owner(s)

Patent OwnerAddress
SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING CORPORATIONNO 1399 ZU CHONG ZHI ROAD ZHANGJIANG HI-TECH PARK PUDONG NEW AREA SHANGHAI 201203

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Li, Binghan Shanghai, CN 10 17

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