Low frequency impedance measurement with source measure units
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United States of America Patent
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Nov 28, 2017
Grant Date -
May 29, 2014
app pub date -
Aug 22, 2011
filing date -
Aug 22, 2011
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Abstract
A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage or current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals.
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