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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE	267 GAJEONG-RO YUSEONG-GU DAEJEON 34113 34113

International Classification(s)

• G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

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• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Cho, Seung Hyun	Sejong, KR	181	1273
Lee, Seung Seok	Daejeon, KR	7	31
Park, Choon Su	Daejeon, KR	3	1
Seo, Dae Cheol	Daejeon, KR	1	1
Seong, Young Min	Busan, KR	1	1

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
7.5 Year Payment	$3600.00	$1800.00	$900.00	May 28, 2025
11.5 Year Payment	$7400.00	$3700.00	$1850.00	May 28, 2029

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 7.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
November 28, 2017	US,9829469,B2   US9829469B2	GRANTED PATENT AS SECOND PUBLICATION
November 12, 2015	US,20150323505,A1   US20150323505A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 9829469

Apparatus and method for measuring nonlinear parameters

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