Method and system for characterization of nano- and micromechanical structures

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United States of America Patent

PATENT NO 9829427
SERIAL NO

14406007

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Abstract

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Method and system in optical microscopy based on the deflection of micro- and nanomechanical structures, upon impact of a laser beam thereon, which simultaneously and automatically provides a spatial map of the static deflection and of the form of various vibration modes, with vertical resolution in the subangstrom range. The invention comprises at least one mechanical structure, an incident laser beam sweeping the surface of the structure, an optometric detector for capturing the laser beam, and frequency excitation means that generate at least two sinusoidal signals at different frequencies in the mechanical structure.

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Patent Owner(s)

Patent OwnerAddress
CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS (CSIC)28006 MADRID

International Classification(s)

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  • 2013 Application Filing Year
  • G01H Class
  • 187 Applications Filed
  • 153 Patents Issued To-Date
  • 81.82 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201320142015201620172018201920200255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Calleja, Gomez Montserrat Madrid, ES 6 26
Gonzalez, Castilla Sheila Madrid, ES 1 4
Monteiro, Kosaka Priscila Madrid, ES 4 7
Pini, Valerio Madrid, ES 7 7
Tamayo, De Miguel Francisco Javier Madrid, ES 11 25

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  • 0 Citation Count
  • G01H Class
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  • 8 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges17317201 - 1011 - 2021 - 300246810121416182022242628303234

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