Topographical measurement system of specular object and topographical measurement method thereof
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United States of America Patent
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Nov 21, 2017
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N/A
app pub date -
May 10, 2016
filing date -
Dec 29, 2015
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Abstract
A topographical measurement system of a specular object and a topographical measurement method thereof are disclosed. The topographical measurement system has a screen, an image capturing device, and an image processing device. The specular object reflects a fringe pattern from the screen, so as to form a virtual image of the fringe pattern. The virtual image is therefore analyzed to obtain a surface profile of the specular object.
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