X-ray scanner with partial energy discriminating detector array
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United States of America Patent
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Nov 21, 2017
Grant Date -
Jul 10, 2014
app pub date -
Jan 6, 2014
filing date -
Jan 7, 2013
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Abstract
The present specification describes a scanning/inspection system configured as a dual-view system using dual-energy sensitive stacked detectors that are partially populated with multi-energy discriminating detectors for overall enhanced energy resolution and therefore improved discrimination of materials through better estimation of material physical properties such as density and effective atomic number.
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