Degradation detection circuit and degradation adjustment apparatus including the same
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United States of America Patent
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Nov 21, 2017
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app pub date -
Jun 3, 2015
filing date -
Jan 28, 2015
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Abstract
A degradation detection circuit may include a degradation unit including multiple delay elements driven by a high voltage for degradation. The high voltage for degradation value may be higher than an operation voltage. The degradation unit may be configured to provide a first delayed signal after passing a test signal through the degradation unit, wherein the test signal retains a pulse for a preset time. The degradation detection circuit may include a reference unit including a plurality of delay elements driven by the operation voltage, and configured to provide a second delayed signal after passing the test signal through the reference unit, a delay setting unit configured to provide a third delayed signal by selectively adding delay elements with respect to the second delayed signal, and a delay checking logic configured to detect a delay of the test signal by comparing the first delayed signal and the third delayed signal.
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