Negative voltage testing methodology and tester
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 21, 2017
Grant Date -
N/A
app pub date -
May 15, 2014
filing date -
Oct 29, 2013
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A negative voltage testing including a monitoring and triggering circuit coupled to a supply voltage rail of a device under test (DUT) and a switching circuit coupled to the monitoring and triggering circuit. The monitoring and triggering circuit is configured to cause the switching circuit to provide a first negative voltage to the supply voltage rail when a supply voltage on the supply voltage rail decays below a predetermined level during a first test of the DUT.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully