Wafer testing probe card
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 21, 2017
Issued Date -
N/A
app pub date -
Jan 24, 2014
filing date -
Jan 28, 2013
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A wafer testing probe card includes a printed circuit board, a flexible circuit board, an elastic piece, and a probe unit. The flexible circuit board is electrically connected to the printed circuit board. The elastic piece is disposed between the printed circuit board and the flexible circuit board. The probe unit includes a probe head and a plurality of probes. The probe head is fixed on the printed circuit board and has a plurality of through holes. The probes respectively pass through the through holes and move up and down relative to the probe head.
First Claim
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International Classification(s)
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01R Class
- 15.81 % this patent is cited more than
- 8 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | May 21, 2025 |
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | May 21, 2029 |
