Internal split faraday shield for a plasma source

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United States of America Patent

PATENT NO 9818584
SERIAL NO

14325146

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An inductively coupled plasma source for a focused charged particle beam system includes a conductive shield within the plasma chamber in order to reduce capacitative coupling to the plasma. The internal conductive shield is maintained at substantially the same potential as the plasma source by a biasing electrode or by the plasma. The internal shield allows for a wider variety of cooling methods on the exterior of the plasma chamber.

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Patent Owner(s)

Patent OwnerAddress
FEI COMPANYHILLSBORO OR

International Classification(s)

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  • 2014 Application Filing Year
  • H01J Class
  • 2291 Applications Filed
  • 1924 Patents Issued To-Date
  • 83.99 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2014201520162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miller, Thomas G Portland, US 80 2850
Zhang, Shouyin Portland, US 21 165

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Patent Citation Ranking

  • 17 Citation Count
  • H01J Class
  • 87.58 % this patent is cited more than
  • 8 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges6221535185612511122323201 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +010020030040050060070080090010001100120013001400150016001700

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