Method and apparatus for testing a transformer

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United States of America Patent

PATENT NO 9817053
APP PUB NO 20160025797A1
SERIAL NO

14782183

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Abstract

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For testing a transformer (20) the transformer (20) is emulated by an equivalent circuit (30) and an accuracy of the transformer (20) relative to the equivalent circuit (30) is determined by evaluating a test response of the transformer (20) and is then automatically converted to an operating condition-related accuracy of the transformer (20).

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Patent Owner(s)

Patent OwnerAddress
OMICRON ELECTRONICS GMBH6833 KLAUS

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Atlas, Dmitry Weiler, AT 2 5
Freiburg, Michael Dortmund, DE 2 5
Jäger, Markus Dornbirn, AT 8 44
Krüger, Michael Altach, AT 11 68
Predl, Florian Götzis, AT 1 4

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  • 3 Citation Count
  • G01R Class
  • 15.81 % this patent is cited more than
  • 8 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges400170425163241623181358501 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0100200300400500600700800900100011001200130014001500160017001800

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