Method and apparatus for testing a transformer
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 14, 2017
Grant Date -
Jan 28, 2016
app pub date -
Feb 4, 2014
filing date -
Apr 5, 2013
priority date (Note) -
In Force
status (Latency Note)
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Abstract
For testing a transformer (20) the transformer (20) is emulated by an equivalent circuit (30) and an accuracy of the transformer (20) relative to the equivalent circuit (30) is determined by evaluating a test response of the transformer (20) and is then automatically converted to an operating condition-related accuracy of the transformer (20).
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
OMICRON ELECTRONICS GMBH | 6833 KLAUS |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Atlas, Dmitry | Weiler, AT | 2 | 5 |
# of filed Patents : 2 Total Citations : 5 | |||
Freiburg, Michael | Dortmund, DE | 2 | 5 |
# of filed Patents : 2 Total Citations : 5 | |||
Jäger, Markus | Dornbirn, AT | 8 | 44 |
# of filed Patents : 8 Total Citations : 44 | |||
Krüger, Michael | Altach, AT | 11 | 68 |
# of filed Patents : 11 Total Citations : 68 | |||
Predl, Florian | Götzis, AT | 1 | 4 |
# of filed Patents : 1 Total Citations : 4 |
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Patent Citation Ranking
- 3 Citation Count
- G01R Class
- 15.81 % this patent is cited more than
- 8 Age
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Jan 26, 1999 | I | Issuance | |
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Mar 08, 1994 | F | Filing | |
Oct 26, 1990 | PD | Priority Date |

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