Method for analysing a sample comprising at least a first and a second scale inhibitor
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Nov 14, 2017
Grant Date -
Oct 6, 2016
app pub date -
Nov 18, 2014
filing date -
Nov 19, 2013
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The invention relates to a method for analysing a sample comprising at least a first and a second scale inhibitor, which scale inhibitors are synthetic organic compounds comprising at least one ionised group. The method comprises optionally diluting and/or purifying the sample, and allowing the sample interact with a reagent comprising lanthanide(III) ion. The sample is excited at a first excitation wavelength and a sample signal deriving from the lanthanide(III) ion is detected at a signal wavelength by using time-resolved luminescence measurement. The total concentration of the first and the second scale inhibitor is determined by using the detected sample signal, and the concentration of the first scale inhibitor in the sample is determined. The concentration of the second scale inhibitor is determined mathematically by using the obtained results for the total concentration and for the first scale inhibitor concentration.
First Claim
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Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- KEMIRA OYJ
International Classification(s)

- 2014 Application Filing Year
- G01N Class
- 10055 Applications Filed
- 7887 Patents Issued To-Date
- 78.44 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Härmä, Harri | Turku, FI | 9 | 19 |
# of filed Patents : 9 Total Citations : 19 | |||
Johnstone, James | Banchory, GB | 8 | 16 |
# of filed Patents : 8 Total Citations : 16 | |||
Lehmusto, Mirva | Turku, FI | 2 | 8 |
# of filed Patents : 2 Total Citations : 8 | |||
Mundill, Paul | Espoo, FI | 6 | 26 |
# of filed Patents : 6 Total Citations : 26 | |||
Nuutinen, Vesa | Helsinki, FI | 14 | 31 |
# of filed Patents : 14 Total Citations : 31 | |||
Siivonen, Joonas | Turku, FI | 3 | 8 |
# of filed Patents : 3 Total Citations : 8 | |||
Tiittanen, Satu | Turku, FI | 3 | 8 |
# of filed Patents : 3 Total Citations : 8 | |||
Toivonen, Susanna | Espoo, FI | 7 | 29 |
# of filed Patents : 7 Total Citations : 29 | |||
Väisänen, Pave | Helsinki, FI | 2 | 8 |
# of filed Patents : 2 Total Citations : 8 |
Cited Art Landscape
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Patent Citation Ranking
- 3 Citation Count
- G01N Class
- 33.94 % this patent is cited more than
- 8 Age
Forward Cite Landscape
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | May 14, 2025 |
11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | May 14, 2029 |
Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge - 7.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
Full Text

Legal Events
Date | Code | Event | Description |
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Nov 03, 2014 | STCH | INFORMATION ON STATUS: PATENT DISCONTINUATION | free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362 |
Oct 05, 2014 | FP | LAPSED DUE TO FAILURE TO PAY MAINTENANCE FEE | Effective Date: Oct 05, 2014 |
Oct 05, 2014 | LAPS | LAPSE FOR FAILURE TO PAY MAINTENANCE FEES | |
May 16, 2014 | REMI | MAINTENANCE FEE REMINDER MAILED | |
Oct 05, 2010 | I | Issuance | |
Dec 31, 2009 | P | Published | |
Jul 13, 2009 | F | Filing | |
Sep 08, 2005 | PD | Priority Date |

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