System and a method for quantitative sample imaging using off-axis interferometry with extended field of view or faster frame rate
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United States of America Patent
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Nov 14, 2017
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Mar 17, 2016
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Sep 17, 2013
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Abstract
The present invention provides a sample inspection and quantitative imaging system and method for performing off-axis interferometric imaging while enabling to record off-axis holograms in an extended field of view (FOV) than possible using a given camera and imaging setup, and thus to enlarge (e.g. double, triple, or even more than this) the interferometric FOV, without changing the imaging parameters, such as the magnification and the resolution.
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