High impedance compliant probe tip
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United States of America Patent
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Nov 7, 2017
Issued Date -
Jun 30, 2016
app pub date -
Dec 31, 2014
filing date -
Dec 31, 2014
priority date (Note) -
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status (Latency Note)
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Abstract
A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.
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