SAR analog-to-digital converter selective synchronization
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United States of America Patent
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Oct 31, 2017
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Nov 4, 2016
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Nov 4, 2016
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Abstract
A successive approximation routine (SAR) analog-to-digital converter integrated circuit can include multiple analog-to-digital converters (ADCs) sharing a reference voltage that can be perturbed by a capacitor array of a digital-to-analog converter (DAC) sampling the reference voltage, which can limit conversion accuracy. Synchronizing every bit trial across the ADCs can improve accuracy but can slow the conversion. Synchronizing a subset of at least one, but fewer than N, bit trials across ADCs can help obtain both speed and robustness. This selected subset can include bit trials corresponding to pro-defined critical events, such as those events for which a stable reference voltage node is particularly desirable.
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