X-ray phase-contrast imaging

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United States of America Patent

PATENT NO 9801600
APP PUB NO 20160135769A1
SERIAL NO

14943157

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Systems and methods for X-ray phase-contrast imaging (PCI) are provided. A quasi-periodic phase grating can be positioned between an object being imaged and a detector. An analyzer grating can be disposed between the phase grating and the detector. Second-order approximation models for X-ray phase retrieval using paraxial Fresnel-Kirchhoff diffraction theory are also provided. An iterative method can be used to reconstruct a phase-contrast image or a dark-field image.

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Patent Owner(s)

Patent OwnerAddress
RENSSELAER POLYTECHNIC INSTITUTE110 8TH STREET J BUILDING TROY NY 12180

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cong, Wenxiang Albany, US 45 635
Wang, Ge Loudonville, US 220 2612
Xi, Yan Troy, US 21 63

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