Loop parameter sensor using repetitive phase errors
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United States of America Patent
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Oct 24, 2017
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app pub date -
Oct 9, 2015
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Apr 18, 2011
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Abstract
A method and system are disclosed for measuring a specified parameter in a phase-locked loop frequency synthesizer (PLL). In one embodiment, the method comprises introducing multiple phase errors in the PLL, measuring a specified aspect of the introduced phase errors, and determining a value for the specified parameter using the measured aspects of the introduced phase errors. In one embodiment, the phase errors are introduced repetitively in the PLL, and these phase errors produce a modified phase difference between the reference signal and the feedback signal in the PPL. In one embodiment, crossover times, when this modified phase difference crosses over a preset value, are determined, and these crossover times are used to determine the value for the specified parameter. In an embodiment, the parameter is calculated as a mathematical function of the crossover times. The parameter may be, for example, the bandwidth of the PLL.
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