Ion source, quadrupole mass spectrometer and residual gas analyzing method
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United States of America Patent
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Oct 24, 2017
Issued Date -
N/A
app pub date -
Dec 6, 2016
filing date -
Dec 11, 2015
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
In order to attain a main objective of the present invention to provide an ion source capable of efficiently extracting ions, the ion source is configured to include: a conductive tubular body having an ion emitting aperture in a tip surface thereof and a penetration portion in a side wall thereof allowing thermo-electrons to pass through from an outside toward an inside; a mesh surrounding an outer periphery of the penetration portion; and a thermionic emission filament surrounding an outer periphery of the mesh, such that the thermo-electrons emitted from the thermionic emission filament pass through the mesh and reach the inside of the conductive tubular body through the penetration portion.
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| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Apr 24, 2025 |
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