Fast hall effect measurement system
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United States of America Patent
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Oct 24, 2017
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app pub date -
Jan 15, 2016
filing date -
Jan 15, 2016
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Abstract
A method and system for measuring Hall effect in a material includes measuring a voltage in two test states, each state alternating the direction and orientation of a current applied across the material or the voltage measured across the material relative to a magnetic field in each state. According to an embodiment, the frequency of measurement at each state differs.
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