Radiation detector and method for reducing the amount of trapped charge carriers in a radiation detector
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United States of America Patent
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Oct 10, 2017
Grant Date -
Jan 5, 2017
app pub date -
Feb 20, 2015
filing date -
Feb 20, 2014
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Abstract
A semiconductor based photon counting detector comprising a substrate (11) of semiconductor material; a detector bias voltage supply (12) for applying a detector bias voltage over the substrate, each time during a data acquisition period (t1); a readout arrangement (13) for repetitively reading out data indicative of charges freed in, and transported through, the substrate (11) in response to photons being absorbed, each time during a readout period (t2) following a data acquisition period, wherein the data contain number of charge pulses of photons being absorbed; an external light source (15) for exposing the substrate for light to enable trapped charge carriers to escape from defect levels in the substrate; and a control device (14) operatively connected to the detector bias voltage supply, the readout arrangement, and the external light source. The control device (14) is configured to control the detector bias voltage supply to switch off the detector bias voltage over the substrate and the external light source (15) to switch on the light, thus exposing the substrate (11) for light to enable trapped charge carriers to escape from defect levels in the substrate, concurrently during at least some of said readout periods.
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