Determination of local contact potential difference by noncontact atomic force microscopy
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United States of America Patent
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Oct 10, 2017
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Mar 3, 2016
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Oct 31, 2013
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Abstract
A method for determining a value of a local contact potential difference by noncontact atomic force microscopy. For one or more cantilever positions above a surface of a sample: i) determining two distinct voltage values of DC voltage applied between an oscillating cantilever and the sample, and ii) determining, by one or more processors, a value of a local contact potential difference based, at least in part, on the two distinct voltage values that were determined.
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