Method and apparatus for determining object characteristics
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United States of America Patent
Stats
-
Oct 10, 2017
Issued Date -
N/A
app pub date -
Jan 20, 2016
filing date -
Jan 24, 2012
priority date (Note) -
In Force
status (Latency Note)
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Abstract
Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation, determining a phase map for at least a region of the target object based on the one or more diffraction patterns, and determining a refractive property of the target object based on the phase map.
First Claim
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International Classification(s)
- 2016 Application Filing Year
- G01M Class
- 1447 Applications Filed
- 1062 Patents Issued To-Date
- 73.40 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 2 Citation Count
- G01M Class
- 21.64 % this patent is cited more than
- 8 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Apr 10, 2025 |
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Apr 10, 2029 |
