Adsorption characteristic measuring apparatus

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United States of America Patent

PATENT NO 9784637
SERIAL NO

14919522

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Abstract

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An adsorption characteristic measuring apparatus is configured to: acquire a unit-time leak pressure value from a pressure increase value of an internal pressure value of a sample tube caused by an non-adsorption gas leaking from the outside of a fitting portion into an inner space of the sample tube; acquire a pressure value at which a temporal change of the internal pressure value of the sample tube assumes an equilibrium state when an adsorption gas present in the reference volume portion is supplied into the sample tube and the sample tube is in a closed state; calculate a pressure value after correction of a real leak pressure value is performed on a measured equilibrium pressure value, as a true equilibrium pressure value, the real leak pressure value being obtained in such a manner that the unit-time leak pressure value is multiplied by a leak time; and calculate an adsorption isotherm.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY3-1 KASUMIGASEKI 1-CHOME CHIYODA-KU TOKYO
MICROTRACBEL CORP8-2-52 NANKO-HIGASHI SUMINOE-KU OSAKA 559-0031

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Endo, Akira Tsukuba, JP 130 1989
Nakai, Kazuyuki Toyonaka, JP 16 108
Okawa, Makoto Toyonaka, JP 7 11
Shimomura, Marie Tsukuba, JP 1 2
Taniguchi, Satoshi Tsukuba, JP 73 1012
Yoshida, Masayuki Toyonaka, JP 126 1284

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