Substrate treating apparatus and method

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United States of America Patent

PATENT NO 9779918
APP PUB NO 20150187545A1
SERIAL NO

14542891

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Abstract

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Provided is a substrate processing apparatus. The substrate treating apparatus includes a processing chamber, a substrate supporting unit, a plasma generation unit, a gas supplying unit, an exhaust adjusting unit, or the like. Residual gas and reaction by-products are generated in a chamber after a substrate is treated by using a gas supplied from the gas supplying unit or plasma excited by the plasma generation unit. The gas exhaust adjusting unit adjusts discharge amounts of residual gas and reaction by-products to adjust residence time or pressure of gas, plasma, or the like in the apparatus, thereby controlling a uniformity of the substrate treating process.

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Patent Owner(s)

Patent OwnerAddress
PSK INCGYEONGGI DO SOUTH KOREA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Chang Weon Hwaseong-si, KR 3 25

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