Device and method for measuring and imaging second harmonic and multi-photon generation scattered radiation

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United States of America Patent

PATENT NO 9778177
SERIAL NO

14599871

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Abstract

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Embodiments of the subject invention relate to a method and apparatus for performing measurements using multiphoton or second harmonic generation (SHG) scattered radiation from a sample including a turbid (scattering) medium includes providing a beam of laser pulses from a laser source having high pulse energies and a repetition rate; splitting the beam of laser pulses into two or more partial beams and focussing and overlaying the partial beams on a sample including the turbid medium; and detecting multiphoton and second harmonic radiation scattered from the sample.

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Patent Owner(s)

Patent OwnerAddress
ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)EPFL INNOVATION PARK BUILDING I LAUSANNE 1015

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Macias, Romero Carlos Lausanne, CH 1 16
Roke, Sylvie Lausanne, CH 1 16

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