Scratch testing apparatus and methods of using same

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United States of America Patent

PATENT NO 9778158
SERIAL NO

14310611

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Abstract

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Provide in one embodiment is an apparatus, comprising an indentor wherein a tip thereof is configured to engage a sample surface, a surface-referencing device configured to establish the position of the indentor relative to the sample surface, a drive mechanism configured to move the indentor along the sample surface to form a scratch, and a measurement device configured to measure at least one of (i) a pile-up height of sample material removed from the scratch and (ii) a width of the scratch.

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Patent Owner(s)

Patent OwnerAddress
MASSACHUSETTS MATERIALS TECHNOLOGIES LLC8A ERIE DRIVE UNIT A NATICK MA 01760

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bellemare, Simon Claude Weston, US 1 10
Normand, Simon Cambridge, US 2 10
Palkovic, Steven D Boston, US 5 25

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