Thickness calibration of an embossing die

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United States of America Patent

PATENT NO 9776372
SERIAL NO

15455413

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Abstract

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There is disclosed a computer program product for carrying out a method of calibrating a thickness of an embossing die, the embossing die being formed from a plurality of ink layers printed by an apparatus. According to the method, an average thickness of an ink layer printed by the apparatus may be calculated, and a target die thickness may be calculated as a function of the average ink layer thickness. A system for implementing a method of calibrating a thickness of an embossing die and a method of measuring a thickness of an embossing die are also disclosed.

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Patent Owner(s)

Patent OwnerAddress
HEWLETT-PACKARD INDIGO B VHOLLAND AMSTELVEEN AMSTELVEEN NORTH HOLLAND

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Peleg, Eyal Zoran, IL 52 2144
Shaul, Itzik Nes Ziona, IL 9 39
Stein, Shahar Zur Yizhak, IL 19 36
Trendafilov, George Nes Ziona, IL 9 37

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