Semiconductor substrate and method for manufacturing semiconductor substrate

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United States of America Patent

PATENT NO 9773678
SERIAL NO

15325016

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Abstract

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A method for manufacturing a semiconductor substrate may comprise irradiating a surface of a first semiconductor layer and a surface of a second semiconductor layer with one or more types of first impurity in a vacuum. The method may comprise bonding the surface of the first semiconductor layer and the surface of the second semiconductor layer to each other in the vacuum. The method may comprise applying heat treatment to the semiconductor substrate produced in the bonding. The first impurity may be an inert impurity that does not generate carriers in the first and second semiconductor layers. The heat treatment may be applied such that a width of an in-depth concentration profile of the first impurity contained in the first and second semiconductor layers is narrower after execution of the heat treatment than before the execution of the heat treatment.

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Patent Owner(s)

  • SICOXS CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hatta, Naoki Tokyo, JP 19 172
Imaoka, Ko Kariya, JP 7 36
Kato, Mitsuharu Tokyo, JP 17 187
Kawahara, Takamitsu Tokyo, JP 19 202
Kobayashi, Motoki Tokyo, JP 73 1060
Makino, Tomoatsu Tokyo, JP 24 528
Minami, Akiyuki Tokyo, JP 13 67
Sakata, Toyokazu Tokyo, JP 12 117
Uchida, Hidetsugu Tokyo, JP 20 158
Yagi, Kuniaki Tokyo, JP 19 208

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