Method and device for light-microscopic imaging of a sample structure

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United States of America Patent

PATENT NO 9772485
SERIAL NO

13806047

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Abstract

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A method for light-microscopy imaging of a sample structure (2, 34) is described, having the following steps:

    preparing the sample structure (2, 34) with markers that are transferrable into a state imageable by light microscopy,generating a sequence of individual-image data sets by sequential imaging of the sample structure (2, 34), in such a way that for each image, only a subset of the totality of the markers is in each case transferred into the state imageable by light microscopy, the markers of the respective subset having an average spacing from one another which is greater than the resolution limit of light-microscopy imaging which determines the extent of a light distribution representing one of the respectively imaged markers,generating at least two data blocks in which multiple successive individual-image data sets are respectively combined,superposing the individual-image data sets contained in the respective data block to yield a superposed-image data set,identifying an image offset between the superposed-image data sets,correcting the individual-image data sets that are contained in at least one of the superposed-image data sets on the basis of the identified image offset,determining center point positions of the light distributions representing the imaged markers, andassembling the center point positions into an offset-corrected overall image.

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Patent Owner(s)

Patent OwnerAddress
LEICA MICROSYSTEMS CMS GMBHERNST-LEITZ-STRASSE 17-37 35578 WETZLAR WETZLAR

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dyba, Marcus Heidelberg, DE 20 198
Seyfried, Volker Nussloch, DE 59 619

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