Prober having linkage portion, method for manufacturing the prober and method of testing circuit boards using the prober
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United States of America Patent
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Sep 26, 2017
Issued Date -
N/A
app pub date -
Jul 16, 2015
filing date -
Jul 29, 2014
priority date (Note) -
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Abstract
A probe unit includes a probe pin and a support unit supporting the probe pin. The support unit includes first and second arms disposed at a distance along a direction in which the probe pin probes a probed object; a holding unit holding base ends of the arms; and a linking unit attached to the probe pin and linking front ends of the arms. The support unit constructs a four-bar linkage that permits linear or approximately linear movement of the probe pin in an opposite direction to the probing direction. The first and second arms have through-holes at positions slightly closer to the front ends than the base ends and positions slightly closer to the base ends than the front ends, center parts between the through-holes function as bars in the four-bar linkage, and formation positions of the through-holes function as joints in the four-bar linkage.
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