Stimulated emission-depletion (STED) microscopy based on time gating of excitation beam and synchronous detection of fluorescence emission

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United States of America Patent

PATENT NO 9772285
SERIAL NO

14911518

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Abstract

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Method of optical microscopy by scanning a sample containing an excitable species, the method comprising:

    directing a first and a second light beam onto respective, partially overlapped areas of the sample, wherein the first light beam is provided for exciting members of the excitable species, and the second light beam is provided for reducing the number of excited members;detecting an optical signal coming from the sample, comprising a main component and a spurious component, during consecutive first and second time gates, the first time gate being provided for detecting the optical signal for a time interval during which the main component and the spurious component are both present, and the second time gate being provided for detecting the optical signal for a time interval during which the main component tends to or is zero;processing the detected optical signal to separate its main component.

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Patent OwnerAddress
FONDAZIONE ISTITUTO ITALIANO DI TECNOLOGIAVIA MOREGO 30 GENOVA 16163

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Diaspro, Alberto Genoa, IT 10 13
Harke, Benjamin Gottingen, DE 16 15
Vicidomini, Giuseppe Genoa, IT 5 13

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