Solar cell testing apparatus and solar cell testing method

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United States of America Patent

PATENT NO 9762179
SERIAL NO

15139605

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Abstract

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A solar cell testing apparatus tests bypass diodes in a solar cell string, which is constructed of solar cell modules including solar cells and the bypass diodes, for open-position failures and includes: a unidirectional element connected between positive and negative electrodes of the solar cell string so as to permit passage of the current outputted when the solar cells generate power; a voltage applier that apples a test voltage, which exceeds a sum of forward direction voltages of the bypass diodes and sets the negative electrode potential higher than the positive electrode potential, across the positive and negative electrodes; a current detector that detects a current flowing in the solar cell string; and a processor that tests for open-position failures by comparing currents detected before and after application of the test voltage with the unidirectional element connected between the electrodes of the solar cell string.

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Patent Owner(s)

Patent OwnerAddress
HIOKI DENKI KABUSHIKI KAISHA81 KOIZUMI UEDA CITY NAGANO PREFECTURE JAPAN UEDA-SHI NAGANO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Higuchi, Masao Nagano, JP 47 346
Tokutake, Fumio Nagano, JP 2 5

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