Fragment ion mass spectra measured with tandem time-of-flight mass spectrometers
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United States of America Patent
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Sep 12, 2017
Grant Date -
Aug 4, 2016
app pub date -
Feb 3, 2016
filing date -
Feb 4, 2015
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Abstract
The present invention provides a method for acquiring fragment ion mass spectra with a time-of-flight mass spectrometer, whereby mixed mass spectra with fragment ions of different parent ion species are acquired and compared with each other in such a way that the signals of those fragment ions which originate from the same parent ion species are determined. The time-of-flight mass spectrometer contains an ion source, a flight path, a reflector and an ion detector. The flight path is preferably field-free and is positioned before the reflector, and the reflector preferably has a quadratically increasing reflection potential.
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