Method of preparing strain released strip-bent x-ray crystal analyzers
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United States of America Patent
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Sep 12, 2017
Grant Date -
Apr 20, 2017
app pub date -
Sep 25, 2016
filing date -
Oct 18, 2015
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Abstract
A method of preparing two dimension bent X-ray crystal analyzers in strips feature is provided. A crystal wafer in strips is bonded to a curved substrate which offers the desired focus length. A crystal wafer in strips is pressed against the surface of the substrate forming curved shape by anodic bonding or glue bonding. The bonding is permanently formed between crystal wafer and its substrate surface, which makes crystal wafer has same curvature as previously prepared substrate.
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