Testing system and method for testing of electrical connections
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United States of America Patent
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Sep 12, 2017
Grant Date -
Aug 20, 2015
app pub date -
Nov 25, 2014
filing date -
Dec 13, 2013
priority date (Note) -
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Abstract
A testing system includes a test machine, a plurality of probe sets, a data input device, a controller, a memory, and a data output device. The test machine has a platform for a DUT to be placed thereon, and a test arm which is movable relative to the platform. The probe sets are provided on the test machine with at least one probe set provided on the test arm to contact the DUT. The data input device is used to input information about the DUT. The controller is electrically connected to the test arm, the probe set on the test arm, and the data input device to move the test arm to a predetermined position according to the inputted information, and to make the probe set contact the DUT for electrical test. The memory saves electrical test result, which is outputted by the data output device.
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